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Karl-Heinz Leitz

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Optics Letters|February 19, 2008
Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolutionGerd Häusler, Claus Richter, Karl-Heinz Leitz, et al.
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Optics Letters|February 19, 2008
Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolutionGerd Häusler, Claus Richter, Karl-Heinz Leitz, et al.
Pageof 1