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Kazutoshi Kaji

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Journal of Electron Microscopy|March 7, 2008
The development and characteristics of a high-speed EELS mapping system for a dedicated STEMShigeto Isakozawa, Kazutoshi Kaji, Konrad Jarausch, et al.
Journal of Electron Microscopy|June 10, 2010
The development of a new windowless XEDS detectorShigeto Isakozawa, Kazutoshi Kaji, Keiji Tamura, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Searching ultimate nanometrology for AlOx thickness in magnetic tunnel junction by analytical electron microscopy and X-ray reflectometrySe Ahn Song, Tatsumi Hirano, Jong Bong Park, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Journal of Electron Microscopy|March 7, 2008
The development and characteristics of a high-speed EELS mapping system for a dedicated STEMShigeto Isakozawa, Kazutoshi Kaji, Konrad Jarausch, et al.
Journal of Electron Microscopy|June 10, 2010
The development of a new windowless XEDS detectorShigeto Isakozawa, Kazutoshi Kaji, Keiji Tamura, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 8, 2007
Searching ultimate nanometrology for AlOx thickness in magnetic tunnel junction by analytical electron microscopy and X-ray reflectometrySe Ahn Song, Tatsumi Hirano, Jong Bong Park, et al.
Pageof 1