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Kenneth M Lakin

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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|July 29, 2005
Thin film resonator technologyKenneth M Lakin
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|June 6, 2002
Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filtersSteven A Birdsall, Patrick B Dever, Joseph B Donovan, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|July 29, 2005
Thin film resonator technologyKenneth M Lakin
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|June 6, 2002
Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filtersSteven A Birdsall, Patrick B Dever, Joseph B Donovan, et al.
Pageof 1