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Kensuke Inai

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Journal of Electron Microscopy|November 9, 2007
Simulation study on image contrast and spatial resolution in helium ion microscopeKensuke Inai, Kaoru Ohya, Tohru Ishitani
Journal of Electron Microscopy|June 18, 2010
Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipmentKaoru Ohya, Kensuke Inai, Ryosuke Kawasaki, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Electron Microscopy|November 9, 2007
Simulation study on image contrast and spatial resolution in helium ion microscopeKensuke Inai, Kaoru Ohya, Tohru Ishitani
Journal of Electron Microscopy|June 18, 2010
Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipmentKaoru Ohya, Kensuke Inai, Ryosuke Kawasaki, et al.
Pageof 1