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Physical Review Letters|October 7, 2024
Achieving Single-Electron Sensitivity at Enhanced Speed in Fully Depleted CCDs with Double-Gate MOSFETsMiguel Sofo-Haro, Kevan Donlon, Juan Estrada, et al.
Physical Review Letters|September 16, 2022
High-Fidelity Ion State Detection Using Trap-Integrated Avalanche PhotodiodesDavid Reens, Michael Collins, Joseph Ciampi, et al.
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