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Kevin Gorczowski

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IEEE Transactions on Pattern Analysis and Machine Intelligence|March 13, 2010
Multi-object analysis of volume, pose, and shape using statistical discriminationKevin Gorczowski, Martin Styner, Ja Yeon Jeong, et al.
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IEEE Transactions on Pattern Analysis and Machine Intelligence|March 13, 2010
Multi-object analysis of volume, pose, and shape using statistical discriminationKevin Gorczowski, Martin Styner, Ja Yeon Jeong, et al.
Pageof 1