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Ultramicroscopy
|
July 3, 2004
Direct measurement of tapping force with a cantilever deflection force sensor
Chanmin Su, Lin Huang, Kevin Kjoller
Ultramicroscopy
|
June 13, 2003
Studies of tip wear processes in tapping mode atomic force microscopy
Chanmin Su, Lin Huang, Kevin Kjoller, et al.
Analytical Chemistry
|
February 25, 2015
Absorption spectroscopy and imaging from the visible through mid-infrared with 20 nm resolution
Aaron M Katzenmeyer, Glenn Holland, Kevin Kjoller, et al.
Applied Spectroscopy
|
October 12, 2011
Spatial differentiation of sub-micrometer domains in a poly(hydroxyalkanoate) copolymer using instrumentation that combines atomic force microscopy (AFM) and infrared (IR) spectroscopy
Curtis Marcott, Michael Lo, Kevin Kjoller, et al.
Journal of Pharmaceutical Sciences
|
March 6, 2012
Nanoscale mid-infrared imaging of phase separation in a drug-polymer blend
Bernard Van Eerdenbrugh, Michael Lo, Kevin Kjoller, et al.
Molecular Pharmaceutics
|
April 10, 2012
Nanoscale mid-infrared evaluation of the miscibility behavior of blends of dextran or maltodextrin with poly(vinylpyrrolidone)
Bernard Van Eerdenbrugh, Michael Lo, Kevin Kjoller, et al.
Journal of Molecular Structure
|
July 16, 2014
Using 2D Correlation Analysis to Enhance Spectral Information Available from Highly Spatially Resolved AFM-IR Spectra
Curtis Marcott, Michael Lo, Qichi Hu, et al.
ACS Nano
|
August 30, 2012
Nanometer-scale infrared spectroscopy of heterogeneous polymer nanostructures fabricated by tip-based nanofabrication
Jonathan R Felts, Kevin Kjoller, Michael Lo, et al.
Experimental Dermatology
|
May 9, 2013
Nanoscale infrared (IR) spectroscopy and imaging of structural lipids in human stratum corneum using an atomic force microscope to directly detect absorbed light from a tunable IR laser source
Curtis Marcott, Michael Lo, Kevin Kjoller, et al.
Analytical Chemistry
|
January 1, 2014
Atomic force microscope controlled topographical imaging and proximal probe thermal desorption/ionization mass spectrometry imaging
Olga S Ovchinnikova, Kevin Kjoller, Gregory B Hurst, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 17) with videos related to
Sort By:
Page
of 2
Ultramicroscopy
|
July 3, 2004
Direct measurement of tapping force with a cantilever deflection force sensor
Chanmin Su, Lin Huang, Kevin Kjoller
Ultramicroscopy
|
June 13, 2003
Studies of tip wear processes in tapping mode atomic force microscopy
Chanmin Su, Lin Huang, Kevin Kjoller, et al.
Analytical Chemistry
|
February 25, 2015
Absorption spectroscopy and imaging from the visible through mid-infrared with 20 nm resolution
Aaron M Katzenmeyer, Glenn Holland, Kevin Kjoller, et al.
Applied Spectroscopy
|
October 12, 2011
Spatial differentiation of sub-micrometer domains in a poly(hydroxyalkanoate) copolymer using instrumentation that combines atomic force microscopy (AFM) and infrared (IR) spectroscopy
Curtis Marcott, Michael Lo, Kevin Kjoller, et al.
Journal of Pharmaceutical Sciences
|
March 6, 2012
Nanoscale mid-infrared imaging of phase separation in a drug-polymer blend
Bernard Van Eerdenbrugh, Michael Lo, Kevin Kjoller, et al.
Molecular Pharmaceutics
|
April 10, 2012
Nanoscale mid-infrared evaluation of the miscibility behavior of blends of dextran or maltodextrin with poly(vinylpyrrolidone)
Bernard Van Eerdenbrugh, Michael Lo, Kevin Kjoller, et al.
Journal of Molecular Structure
|
July 16, 2014
Using 2D Correlation Analysis to Enhance Spectral Information Available from Highly Spatially Resolved AFM-IR Spectra
Curtis Marcott, Michael Lo, Qichi Hu, et al.
ACS Nano
|
August 30, 2012
Nanometer-scale infrared spectroscopy of heterogeneous polymer nanostructures fabricated by tip-based nanofabrication
Jonathan R Felts, Kevin Kjoller, Michael Lo, et al.
Experimental Dermatology
|
May 9, 2013
Nanoscale infrared (IR) spectroscopy and imaging of structural lipids in human stratum corneum using an atomic force microscope to directly detect absorbed light from a tunable IR laser source
Curtis Marcott, Michael Lo, Kevin Kjoller, et al.
Analytical Chemistry
|
January 1, 2014
Atomic force microscope controlled topographical imaging and proximal probe thermal desorption/ionization mass spectrometry imaging
Olga S Ovchinnikova, Kevin Kjoller, Gregory B Hurst, et al.
Page
of 2