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Kian M M Goeloe

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ACS Photonics|December 23, 2024

Nanometer Interlaced Displacement Metrology Using Diffractive Pancharatnam-Berry and Detour Phase MetasurfacesNick Feldman, Kian M M Goeloe, Arie J den Boef, et al.

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Search research articles

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ACS Photonics|December 23, 2024

Nanometer Interlaced Displacement Metrology Using Diffractive Pancharatnam-Berry and Detour Phase MetasurfacesNick Feldman, Kian M M Goeloe, Arie J den Boef, et al.

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