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Heredity|December 9, 2021
Genetic dissection for head blast resistance in wheat using two mapping populationsXinyao He, Muhammad Rezaul Kabir, Krishna K Roy, et al.
Phytopathology|March 17, 2025
A Novel Quantitative Trait Locus on Chromosome 7D Derived from Aegilops tauschii Confers Moderate Field Resistance to Wheat BlastXinyao He, Cong Li, Masahiro Kishii, et al.
Scientific Reports|October 3, 2020
Genome-wide association mapping for wheat blast resistance in CIMMYT's international screening nurseries evaluated in Bolivia and BangladeshPhilomin Juliana, Xinyao He, Muhammad R Kabir, et al.
TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik|June 4, 2020
QTL mapping for field resistance to wheat blast in the Caninde#1/Alondra populationXinyao He, Muhammad Rezaul Kabir, Krishna K Roy, et al.
Frontiers in Plant Science|August 9, 2021
Wheat Blast: A Disease Spreading by Intercontinental Jumps and Its Management StrategiesPawan K Singh, Navin C Gahtyari, Chandan Roy, et al.
Plants (Basel, Switzerland)|June 2, 2021
Identification of QTLs for Spot Blotch Resistance in Two Bi-Parental Mapping Populations of WheatNavin C Gahtyari, Chandan Roy, Xinyao He, et al.
Genes|April 23, 2022
Identification of Genomic Regions and Sources for Wheat Blast Resistance through GWAS in Indian Wheat GenotypesRahul M Phuke, Xinyao He, Philomin Juliana, et al.
Plants (Basel, Switzerland)|December 28, 2021
New Genotypes and Genomic Regions for Resistance to Wheat Blast in South Asian GermplasmChandan Roy, Philomin Juliana, Muhammad R Kabir, et al.
Frontiers in Genetics|May 31, 2021
Screening and Mapping for Head Blast Resistance in a Panel of CIMMYT and South Asian Bread Wheat GermplasmXinyao He, Philomin Juliana, Muhammad R Kabir, et al.
TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik|April 13, 2022
Genomic selection for spot blotch in bread wheat breeding panels, full-sibs and half-sibs and index-based selection for spot blotch, heading and plant heightPhilomin Juliana, Xinyao He, Jesse Poland, et al.
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