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Chemistry (Weinheim an Der Bergstrasse, Germany)|April 19, 2022
Controllable Zeolite AST Crystallization: Between Classical and Reversed Crystal GrowthQiudi Yue, Kristina Kutukova, Ang Li, et al.
Nanomaterials (Basel, Switzerland)|March 12, 2024
Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray SourceKristina Kutukova, Bartlomiej Lechowski, Joerg Grenzer, et al.
Chemistry (Weinheim an Der Bergstrasse, Germany)|May 26, 2022
Controllable Zeolite AST Crystallization: Between Classical and Reversed Crystal GrowthQiudi Yue, Kristina Kutukova, Ang Li, et al.
Nanomaterials (Basel, Switzerland)|January 26, 2024
Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray OpticsBartlomiej Lechowski, Kristina Kutukova, Joerg Grenzer, et al.
Materials (Basel, Switzerland)|July 29, 2023
3D Multi-Ion Corrosion Model in Hierarchically Structured Cementitious Materials Obtained from Nano-XCT DataKrzysztof Szyszkiewicz-Warzecha, Jakub Stec, Jan Deja, et al.
Nanomaterials (Basel, Switzerland)|October 23, 2021
Monitored Tomographic Reconstruction-An Advanced Tool to Study the 3D Morphology of NanomaterialsKonstantin Bulatov, Marina Chukalina, Kristina Kutukova, et al.
Micron (Oxford, England : 1993)|April 4, 2022
Multi-scale microscopy study of 3D morphology and structure of MoNi4/MoO2@Ni electrocatalytic systems for fast water dissociationEhrenfried Zschech, Emre Topal, Kristina Kutukova, et al.
Scientific Reports|December 26, 2019
3D Diatom-Designed and Selective Laser Melting (SLM) Manufactured Metallic StructuresIzabela Zglobicka, Agnieszka Chmielewska, Emre Topal, et al.
Nanomaterials (Basel, Switzerland)|April 2, 2020
Anisotropy of Mechanical Properties of Pinctada margaritifera Mollusk ShellMartyna Strąg, Łukasz Maj, Magdalena Bieda, et al.
Small Methods|November 29, 2022
Spectromicroscopy of Nanoscale Materials in the Tender X-Ray Regime Enabled by a High Efficient Multilayer-Based Grating MonochromatorStephan Werner, Peter Guttmann, Frank Siewert, et al.
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