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Ultramicroscopy|September 15, 2018
Revealing the 3-dimensional shape of atom probe tips by atomic force microscopyClaudia Fleischmann, Kristof Paredis, Davit Melkonyan, et al.
Ultramicroscopy|July 14, 2019
Carrier profiling with fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InPOberon Dixon-Luinenburg, Umberto Celano, Wilfried Vandervorst, et al.
Scientific Reports|September 11, 2020
The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurementsKomal Pandey, Kristof Paredis, Thomas Hantschel, et al.
Nanotechnology|March 29, 2019
Effects of buried grain boundaries in multilayer MoS2Jonathan Ludwig, Ankit Nalin Mehta, Marco Mascaro, et al.
Journal of the American Chemical Society|July 28, 2011
Evolution of the structure and chemical state of Pd nanoparticles during the in situ catalytic reduction of NO with H2Kristof Paredis, Luis K Ono, Farzad Behafarid, et al.
Scientific Reports|February 16, 2018
Mesoscopic physical removal of material using sliding nano-diamond contactsUmberto Celano, Feng-Chun Hsia, Danielle Vanhaeren, et al.
Journal of the American Chemical Society|April 8, 2011
Structure, chemical composition, and reactivity correlations during the in situ oxidation of 2-propanolKristof Paredis, Luis K Ono, Simon Mostafa, et al.
Nanomaterials (Basel, Switzerland)|August 16, 2020
Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening ChargesUmberto Celano, Andres Gomez, Paola Piedimonte, et al.
Nanotechnology|August 3, 2018
Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformityDaniele Chiappe, Jonathan Ludwig, Alessandra Leonhardt, et al.
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