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Journal of Nanoscience and Nanotechnology
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December 1, 2007
Atomistic simulation of boron diffusion with charged defects and diffusivity in strained Si/SiGe
Young-Kyu Kim, Kwan-Sun Yoon, Joong-Sik Kim, et al.
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of 1
Search research articles
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Showing results (1-10 of 1) with videos related to
Sort By:
Page
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Journal of Nanoscience and Nanotechnology
|
December 1, 2007
Atomistic simulation of boron diffusion with charged defects and diffusivity in strained Si/SiGe
Young-Kyu Kim, Kwan-Sun Yoon, Joong-Sik Kim, et al.
Page
of 1