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Micron (Oxford, England : 1993)|April 15, 2026
Pressure-driven selective sublimation and electron-beam-induced sputtering during high vacuum heating observed by electron microscopyKyu-Jin Jo, Jin-Su Oh, Cheol-Woong YangMicron (Oxford, England : 1993)|June 7, 2023
Measurement of dielectric function and bandgap of germanium telluride using monochromated electron energy-loss spectroscopyJin-Su Oh, Kyu-Jin Jo, Min-Chul Kang, et al.Nano Letters|March 17, 2023
Wafer-Scale Epitaxial Growth of an Atomically Thin Single-Crystal Insulator as a Substrate of Two-Dimensional Material Field-Effect TransistorsEun Hye Kim, Do Hee Lee, Tae Jun Gu, et al.Pageof 1