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L A Giannuzzi

Showing results (1-10 of 5) with videos related to

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Ultramicroscopy|September 24, 2011
Non-monotonic material contrast in scanning ion and scanning electron imagesL A Giannuzzi, M Utlaut
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 20, 2013
Comparison of channeling contrast between ion and electron imagesL A Giannuzzi, J R Michael
Microscopy Research and Technique|June 20, 1998
Applications of the FIB lift-out technique for TEM specimen preparationL A Giannuzzi, J L Drown, S R Brown, et al.
Nature|October 10, 2008
High-temperature interface superconductivity between metallic and insulating copper oxidesA Gozar, G Logvenov, L Fitting Kourkoutis, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 17, 2003
The correlation between ion beam/material interactions and practical FIB specimen preparationB I Prenitzer, C A Urbanik-Shannon, L A Giannuzzi, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|September 24, 2011
Non-monotonic material contrast in scanning ion and scanning electron imagesL A Giannuzzi, M Utlaut
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 20, 2013
Comparison of channeling contrast between ion and electron imagesL A Giannuzzi, J R Michael
Microscopy Research and Technique|June 20, 1998
Applications of the FIB lift-out technique for TEM specimen preparationL A Giannuzzi, J L Drown, S R Brown, et al.
Nature|October 10, 2008
High-temperature interface superconductivity between metallic and insulating copper oxidesA Gozar, G Logvenov, L Fitting Kourkoutis, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 17, 2003
The correlation between ion beam/material interactions and practical FIB specimen preparationB I Prenitzer, C A Urbanik-Shannon, L A Giannuzzi, et al.
Pageof 1