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Applied Optics|December 4, 2010
Transmitted scattered light from a thin film with shallow random rough interfacesR G Llamas, L E RegaladoApplied Optics|September 22, 2010
Method for calculating optical coating stabilitiesL E Regalado, R Garcia-LlamasApplied Optics|March 18, 2008
Correction masks for thickness uniformity in large-area thin filmsF Villa, A Martínez, L E RegaladoApplied Optics|June 12, 2010
Determination of (n,k) for absorbing thin films using reflectance measurementsJ M Siqueiros, L E Regalado, R MachorroApplied Optics|August 12, 2010
Optical properties of parylene and its use as substrate in beam splittersR Machorro, L E Regalado, J M SiqueirosApplied Optics|August 14, 2010
Attenuated-total-reflection technique for the determination of optical constantsL E Regalado, R Machorro, J M SiqueirosApplied Optics|June 10, 2010
Determination of the optical constants of MgF(2) and ZnS from spectrophotometric measurements and the classical oscillator methodJ M Siqueiros, R Machorro, L E RegaladoApplied Optics|October 2, 2010
Admittance of rugate filters derived from a 2 × 2 inhomogeneous matrixF Villa, R Machorro, J Siqueiros, et al.Applied Optics|August 4, 2012
Determination of quality and adulteration of tequila through the use of surface plasmon resonanceD Luna-Moreno, D Monzón-Hernández, E Noé-Arias, et al.Optics Letters|November 17, 2007
Photonic crystal sensor based on surface waves for thin-film characterizationF Villa, L E Regalado, F Ramos-Mendieta, et al.Pageof 1