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Applied Optics|March 8, 2008
Spectroscopic generalized ellipsometry based on fourier analysisA En Naciri, L Johann, R Kleim
Forensic Science, Medicine, and Pathology|February 18, 2022
The prognostic value of the Frank signJ Prangenberg, E Doberentz, L Johann, et al.
Applied Optics|March 25, 2008
Surface Effects of the HgI(2) Crystal Characterized by Spectroscopic EllipsometryA En Naciri, L Johann, R Kleim, et al.
Applied Optics|February 29, 2008
Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2A En Naciri, L Johann, R Kleim, et al.
Nanotechnology|July 9, 2009
Dielectric function of ZnTe nanocrystals by spectroscopic ellipsometryF Ahmed, A En Naciri, J J Grob, et al.
The Journal of Chemical Physics|December 3, 2008
Influence of the implantation profiles of Si(+) on the dielectric function and optical transitions in silicon nanocrystalsA En Naciri, M Mansour, L Johann, et al.
Plant Biology (Stuttgart, Germany)|September 9, 2024
Unravelling soybean responses to early and late Tetranychus urticae (Acari: Tetranychidae) infestationK Ruffatto, L C O da Silva, C D O Neves, et al.
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