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Journal of Microscopy
|
April 29, 2005
Estimation of the standard deviation in three-dimensional microscopy by spatial statistics
L M Sanchez-Brea, E Bernabeu
Applied Optics
|
March 14, 2008
Optical technique for the automatic detection and measurement of surface defects on thin metallic wires
L M Sanchez-Brea, P Siegmann, M A Rebollo, et al.
Applied Optics
|
March 20, 2008
Histogram-based method for contrast measurement
L M Sanchez-Brea, J A Quiroga, A Garcia-Botella, et al.
Applied Optics
|
March 8, 2008
Modulation transfer function of translucent rough sheets
A Garcia-Botella, L M Sanchez-Brea, D Vazquez-Molini, et al.
Optics Express
|
March 4, 2011
Fast optical source for quantum key distribution based on semiconductor optical amplifiers
M Jofre, A Gardelein, G Anzolin, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Journal of Microscopy
|
April 29, 2005
Estimation of the standard deviation in three-dimensional microscopy by spatial statistics
L M Sanchez-Brea, E Bernabeu
Applied Optics
|
March 14, 2008
Optical technique for the automatic detection and measurement of surface defects on thin metallic wires
L M Sanchez-Brea, P Siegmann, M A Rebollo, et al.
Applied Optics
|
March 20, 2008
Histogram-based method for contrast measurement
L M Sanchez-Brea, J A Quiroga, A Garcia-Botella, et al.
Applied Optics
|
March 8, 2008
Modulation transfer function of translucent rough sheets
A Garcia-Botella, L M Sanchez-Brea, D Vazquez-Molini, et al.
Optics Express
|
March 4, 2011
Fast optical source for quantum key distribution based on semiconductor optical amplifiers
M Jofre, A Gardelein, G Anzolin, et al.
Page
of 1