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ACS Nano
|
November 14, 2013
Metal contacts on physical vapor deposited monolayer MoS2
Cheng Gong, Chunming Huang, Justin Miller, et al.
Nano Letters
|
August 6, 2016
Covalent Nitrogen Doping and Compressive Strain in MoS2 by Remote N2 Plasma Exposure
Angelica Azcatl, Xiaoye Qin, Abhijith Prakash, et al.
ACS Applied Materials & Interfaces
|
July 16, 2020
Atomic Layer Deposition of Layered Boron Nitride for Large-Area 2D Electronics
Jaebeom Lee, Arul V Ravichandran, Jaidah Mohan, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
July 20, 2018
High-Mobility Helical Tellurium Field-Effect Transistors Enabled by Transfer-Free, Low-Temperature Direct Growth
Guanyu Zhou, Rafik Addou, Qingxiao Wang, et al.
ACS Applied Materials & Interfaces
|
November 29, 2018
Investigation of the Physical Properties of Plasma Enhanced Atomic Layer Deposited Silicon Nitride as Etch Stopper
Harrison Sejoon Kim, Xin Meng, Si Joon Kim, et al.
ACS Nano
|
December 16, 2014
HfSe2 thin films: 2D transition metal dichalcogenides grown by molecular beam epitaxy
Ruoyu Yue, Adam T Barton, Hui Zhu, et al.
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Search research articles
Search
Showing results (11-20 of 16) with videos related to
Sort By:
Page
of 2
You have reached the last page of results.
This site can display upto 16 results.
ACS Nano
|
November 14, 2013
Metal contacts on physical vapor deposited monolayer MoS2
Cheng Gong, Chunming Huang, Justin Miller, et al.
Nano Letters
|
August 6, 2016
Covalent Nitrogen Doping and Compressive Strain in MoS2 by Remote N2 Plasma Exposure
Angelica Azcatl, Xiaoye Qin, Abhijith Prakash, et al.
ACS Applied Materials & Interfaces
|
July 16, 2020
Atomic Layer Deposition of Layered Boron Nitride for Large-Area 2D Electronics
Jaebeom Lee, Arul V Ravichandran, Jaidah Mohan, et al.
Advanced Materials (Deerfield Beach, Fla.)
|
July 20, 2018
High-Mobility Helical Tellurium Field-Effect Transistors Enabled by Transfer-Free, Low-Temperature Direct Growth
Guanyu Zhou, Rafik Addou, Qingxiao Wang, et al.
ACS Applied Materials & Interfaces
|
November 29, 2018
Investigation of the Physical Properties of Plasma Enhanced Atomic Layer Deposited Silicon Nitride as Etch Stopper
Harrison Sejoon Kim, Xin Meng, Si Joon Kim, et al.
ACS Nano
|
December 16, 2014
HfSe2 thin films: 2D transition metal dichalcogenides grown by molecular beam epitaxy
Ruoyu Yue, Adam T Barton, Hui Zhu, et al.
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of 2