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Lars-Oliver Heim

Showing results (1-10 of 4) with videos related to

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The Review of Scientific Instruments|May 17, 2007
Oscillation-induced static deflection in scanning force microscopyLars-Oliver Heim, Diethelm Johannsmann
Langmuir : the ACS Journal of Surfaces and Colloids|October 26, 2013
Measurement of line tension on droplets in the submicrometer rangeLars-Oliver Heim, Elmar Bonaccurso
Langmuir : the ACS Journal of Surfaces and Colloids|April 20, 2005
Tilt of atomic force microscope cantilevers: effect on spring constant and adhesion measurementsLars-Oliver Heim, Michael Kappl, Hans-Jürgen Butt
Langmuir : the ACS Journal of Surfaces and Colloids|December 15, 2015
Mechanism for Asymmetric Nanoscale Electrowetting of an Ionic Liquid on GrapheneFereshte Taherian, Frédéric Leroy, Lars-Oliver Heim, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|May 17, 2007
Oscillation-induced static deflection in scanning force microscopyLars-Oliver Heim, Diethelm Johannsmann
Langmuir : the ACS Journal of Surfaces and Colloids|October 26, 2013
Measurement of line tension on droplets in the submicrometer rangeLars-Oliver Heim, Elmar Bonaccurso
Langmuir : the ACS Journal of Surfaces and Colloids|April 20, 2005
Tilt of atomic force microscope cantilevers: effect on spring constant and adhesion measurementsLars-Oliver Heim, Michael Kappl, Hans-Jürgen Butt
Langmuir : the ACS Journal of Surfaces and Colloids|December 15, 2015
Mechanism for Asymmetric Nanoscale Electrowetting of an Ionic Liquid on GrapheneFereshte Taherian, Frédéric Leroy, Lars-Oliver Heim, et al.
Pageof 1