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The Journal of the Acoustical Society of America|November 1, 2022
Focal depth localization for highly focused transducers in isotropic materialsLauren Katch, Andrea P Argüelles
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|October 2, 2023
Shear Wave Ultrasound Inspection of Flaws in Silicon Wafers Using Focused TransducersLauren Katch, Wei Yi Yeoh, Odissei Touzanov, et al.
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