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IEEE Transactions on Pattern Analysis and Machine Intelligence|May 15, 2020
The Bayesian CutPetr Taborsky, Laurent Vermue, Maciej Korzepa, et al.IEEE Transactions on Pattern Analysis and Machine Intelligence|November 4, 2021
Bringing Light Into the Dark: A Large-Scale Evaluation of Knowledge Graph Embedding Models Under a Unified FrameworkMehdi Ali, Max Berrendorf, Charles Tapley Hoyt, et al.Pageof 1