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Lawrence T Hudson

Showing results (1-10 of 17) with videos related to

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Measurement Science & Technology|August 9, 2016
An objectively-analyzed method for measuring the useful penetration of x-ray imaging systemsJack L Glover, Lawrence T Hudson
Medical Physics|September 11, 2012
Comment on "estimation of organ and effective dose due to Compton backscatter security scans" [Med. Phys. 39, 3396 (2012)]Jack L Glover, Lawrence T Hudson
Journal of Research of the National Institute of Standards and Technology|November 25, 2015
The Metrology of a Rastered Spot of X Rays used in Security ScreeningLawrence T Hudson, Jack L Glover, Ronaldo Minniti
Journal of Testing and Evaluation|May 17, 2019
Improved Threat Identification Using Tonemapping of High-Dynamic-Range X-ray ImagesJack L Glover, Lawrence T Hudson, Nicholas G Paulter
The Review of Scientific Instruments|November 3, 2017
X-ray spectrometer having 12 000 resolving power at 8 keV energyJohn F Seely, Lawrence T Hudson, Albert Henins, et al.
Applied Optics|January 6, 2009
X-ray modulation transfer functions of photostimulable phosphor image plates and scannersJohn F Seely, Glenn E Holland, Lawrence T Hudson, et al.
Applied Optics|May 22, 2008
Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometersJohn F Seely, Lawrence T Hudson, Glenn E Holland, et al.
Journal of Testing and Evaluation|May 17, 2019
Testing the Image Quality of Cabinet X-ray Systems for Security Screening: The Revised ASTM F792 StandardJack L Glover, Ronald E Tosh, Lawrence T Hudson, et al.
Applied Optics|September 11, 2019
High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6  keV to 22  keV energy rangeJohn F Seely, Eric Galtier, Lawrence T Hudson, et al.
Optics Letters|December 16, 2014
Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6-13  keV energy rangeJohn F Seely, Lawrence T Hudson, Jack L Glover, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Measurement Science & Technology|August 9, 2016
An objectively-analyzed method for measuring the useful penetration of x-ray imaging systemsJack L Glover, Lawrence T Hudson
Medical Physics|September 11, 2012
Comment on "estimation of organ and effective dose due to Compton backscatter security scans" [Med. Phys. 39, 3396 (2012)]Jack L Glover, Lawrence T Hudson
Journal of Research of the National Institute of Standards and Technology|November 25, 2015
The Metrology of a Rastered Spot of X Rays used in Security ScreeningLawrence T Hudson, Jack L Glover, Ronaldo Minniti
Journal of Testing and Evaluation|May 17, 2019
Improved Threat Identification Using Tonemapping of High-Dynamic-Range X-ray ImagesJack L Glover, Lawrence T Hudson, Nicholas G Paulter
The Review of Scientific Instruments|November 3, 2017
X-ray spectrometer having 12 000 resolving power at 8 keV energyJohn F Seely, Lawrence T Hudson, Albert Henins, et al.
Applied Optics|January 6, 2009
X-ray modulation transfer functions of photostimulable phosphor image plates and scannersJohn F Seely, Glenn E Holland, Lawrence T Hudson, et al.
Applied Optics|May 22, 2008
Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometersJohn F Seely, Lawrence T Hudson, Glenn E Holland, et al.
Journal of Testing and Evaluation|May 17, 2019
Testing the Image Quality of Cabinet X-ray Systems for Security Screening: The Revised ASTM F792 StandardJack L Glover, Ronald E Tosh, Lawrence T Hudson, et al.
Applied Optics|September 11, 2019
High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6  keV to 22  keV energy rangeJohn F Seely, Eric Galtier, Lawrence T Hudson, et al.
Optics Letters|December 16, 2014
Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6-13  keV energy rangeJohn F Seely, Lawrence T Hudson, Jack L Glover, et al.
Pageof 2