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Letty Koopman

Showing results (1-10 of 5) with videos related to

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Educational and Psychological Measurement|November 20, 2024
Investigating the Ordering Structure of Clustered Items Using Nonparametric Item Response TheoryLetty Koopman, Johan Braeken
Psychometrika|September 26, 2023
Maximum Augmented Empirical Likelihood Estimation of Categorical Marginal Models for Large Sparse Contingency TablesL Andries van der Ark, Wicher P Bergsma, Letty Koopman
Quality of Life Research : an International Journal of Quality of Life Aspects of Treatment, Care and Rehabilitation|May 13, 2021
A two-step, test-guided Mokken scale analysis, for nonclustered and clustered dataLetty Koopman, Bonne J H Zijlstra, L Andries van der Ark
The British Journal of Mathematical and Statistical Psychology|June 25, 2019
Standard errors of two-level scalability coefficientsLetty Koopman, Bonne J H Zijlstra, L Andries van der Ark
Applied Psychological Measurement|April 29, 2020
Bias of Two-Level Scalability Coefficients and Their Standard ErrorsLetty Koopman, Bonne J H Zijlstra, Mark de Rooij, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Educational and Psychological Measurement|November 20, 2024
Investigating the Ordering Structure of Clustered Items Using Nonparametric Item Response TheoryLetty Koopman, Johan Braeken
Psychometrika|September 26, 2023
Maximum Augmented Empirical Likelihood Estimation of Categorical Marginal Models for Large Sparse Contingency TablesL Andries van der Ark, Wicher P Bergsma, Letty Koopman
Quality of Life Research : an International Journal of Quality of Life Aspects of Treatment, Care and Rehabilitation|May 13, 2021
A two-step, test-guided Mokken scale analysis, for nonclustered and clustered dataLetty Koopman, Bonne J H Zijlstra, L Andries van der Ark
The British Journal of Mathematical and Statistical Psychology|June 25, 2019
Standard errors of two-level scalability coefficientsLetty Koopman, Bonne J H Zijlstra, L Andries van der Ark
Applied Psychological Measurement|April 29, 2020
Bias of Two-Level Scalability Coefficients and Their Standard ErrorsLetty Koopman, Bonne J H Zijlstra, Mark de Rooij, et al.
Pageof 1