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Science (New York, N.Y.)|August 1, 2024
Event-responsive scanning transmission electron microscopyJonathan J P Peters, Bryan W Reed, Yu Jimbo, et al.
Ultramicroscopy|June 17, 2024
New Poisson denoising method for pulse-count STEM imagingTaichi Kusumi, Shun Katakami, Ryo Ishikawa, et al.
Physical Review Letters|July 2, 2016
Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron MicroscopyKarel H W van den Bos, Annick De Backer, Gerardo T Martinez, et al.
Nanoscale|February 20, 2013
Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheetsAleksey Shmeliov, Judy S Kim, Konstantin B Borisenko, et al.
ACS Nano|July 23, 2013
Probing the bonding in nitrogen-doped graphene using electron energy loss spectroscopyRebecca J Nicholls, Adrian T Murdock, Joshua Tsang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 4, 2008
High-resolution TEM and the application of direct and indirect aberration correctionCrispin J D Hetherington, Lan-Yun Shery Chang, Sarah Haigh, et al.
ACS Nano|June 19, 2010
Direct imaging and chemical identification of the encapsulated metal atoms in bimetallic endofullerene peapodsRebecca J Nicholls, Kasim Sader, Jamie H Warner, et al.
Journal of the American Chemical Society|August 14, 2024
Visualization of Tetrahedral Li in the Alkali Layers of Li-Rich Layered Metal OxidesWeixin Song, Miguel A Pérez-Osorio, Jun Chen, et al.
Advanced Engineering Materials|April 21, 2015
Crystal Structure of the ZrO Phase at Zirconium/Zirconium Oxide InterfacesRebecca J Nicholls, Na Ni, Sergio Lozano-Perez, et al.
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