Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ludovic Goux

Showing results (11-20 of 14) with videos related to

Pageof 2
Sort By:
You have reached the last page of results.This site can display upto 14 results.
ACS Nano|April 1, 2024
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy MeasurementsAlbert Minj, Vivek Mootheri, Sreetama Banerjee, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 17, 2024
Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe TomographyRichard J H Morris, Jhao-Rong Lin, Jeroen E Scheerder, et al.
ACS Nano|November 3, 2021
Standards for the Characterization of Endurance in Resistive Switching DevicesMario Lanza, Rainer Waser, Daniele Ielmini, et al.
Faraday Discussions|January 22, 2019
Electrochemical metallization ReRAMs (ECM) - Experiments and modelling: general discussionElia Ambrosi, Philip Bartlett, Alexandra I Berg, et al.
Pageof 2

Showing results (11-20 of 14) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 14 results.
ACS Nano|April 1, 2024
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy MeasurementsAlbert Minj, Vivek Mootheri, Sreetama Banerjee, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 17, 2024
Significant Oxygen Underestimation When Quantifying Barium-Doped SrTiO Layers by Atom Probe TomographyRichard J H Morris, Jhao-Rong Lin, Jeroen E Scheerder, et al.
ACS Nano|November 3, 2021
Standards for the Characterization of Endurance in Resistive Switching DevicesMario Lanza, Rainer Waser, Daniele Ielmini, et al.
Faraday Discussions|January 22, 2019
Electrochemical metallization ReRAMs (ECM) - Experiments and modelling: general discussionElia Ambrosi, Philip Bartlett, Alexandra I Berg, et al.
Pageof 2