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Ultramicroscopy|July 23, 2016
Measurement of the dielectric function of α-Al2O3 by transmission electron microscopy - Electron energy-loss spectroscopy without Cerenkov radiation effectsNorihito Sakaguchi, Luka Tanda, Yuji KunisadaMicroscopy (Oxford, England)|July 8, 2016
Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effectNorihito Sakaguchi, Luka Tanda, Yuji KunisadaPageof 1