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Optics Letters|September 18, 2009
Light scattering from cylindrical structures on surfacesM A TaubenblattApplied Optics|August 21, 2010
Patterned wafer inspection using spatial filtering for the cluster environmentM A Taubenblatt, J S BatchelderApplied Optics|August 19, 2010
Measurement of the size and refractive index of a small particle using the complex forward-scattered electromagnetic fieldM A Taubenblatt, J S BatchelderPageof 1