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Ultramicroscopy|March 12, 2017
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structureM Alania, T Altantzis, A De Backer, et al.Nanoscale|June 17, 2017
Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunitiesA De Backer, L Jones, I Lobato, et al.Ultramicroscopy|September 25, 2017
Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurementM Alania, I Lobato, S Van AertUltramicroscopy|June 6, 2023
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural networkI Lobato, A De Backer, S Van AertUltramicroscopy|February 16, 2023
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projectionA De Backer, S Bals, S Van AertUltramicroscopy|May 29, 2017
How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?M Alania, A De Backer, I Lobato, et al.Ultramicroscopy|June 21, 2016
Progress and new advances in simulating electron microscopy datasets using MULTEMI Lobato, S Van Aert, J VerbeeckUltramicroscopy|September 21, 2011
High precision measurements of atom column positions using model-based exit wave reconstructionA De Backer, S Van Aert, D Van DyckUltramicroscopy|February 22, 2024
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determinationD G Şentürk, A De Backer, S Van AertUltramicroscopy|December 16, 2014
Optimal experimental design for nano-particle atom-counting from high-resolution STEM imagesA De Backer, A De Wael, J Gonnissen, et al.Pageof 21