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Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Intrinsic Capacitances and Inductances of Quantum Hall Effect DevicesM E Cage, A JefferyJournal of Research of the National Institute of Standards and Technology|December 24, 2016
A Problem in AC Quantized Hall Resistance Measurements and a Proposed SolutionM E Cage, A JefferyJournal of Research of the National Institute of Standards and Technology|November 21, 2017
Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series ConnectionsA Jeffery, R E Elmquist, M E CageJournal of Research of the National Institute of Standards and Technology|July 2, 2016
Initial NIST AC QHR MeasurementsM E Cage, S H Shields, A JefferyJournal of Research of the National Institute of Standards and Technology|December 24, 2016
Calculating the Effects of Longitudinal Resistance in Multi-Series-Connected Quantum Hall Effect DevicesM E Cage, A Jeffery, R E Elmquist, et al.Journal of Research of the National Institute of Standards and Technology|January 6, 2017
Dependence of Quantized Hall Effect Breakdown Voltage on Magnetic Field and CurrentM E CageJournal of Research of the National Institute of Standards and Technology|January 1, 1997
Current Distributions in Quantum Hall Effect DevicesM E CageJournal of Research of the National Institute of Standards and Technology|January 1, 1996
Evidence That Voltage Rather Than Resistance is Quantized in Breakdown of the Quantum Hall EffectM E CageJournal of Research of the National Institute of Standards and Technology|June 17, 2016
Temperature Dependence of the Hall and Longitudinal Resistances in a Quantum Hall Resistance StandardJ Matthews, M E CageJournal of Research of the National Institute of Standards and Technology|November 21, 2017
Using Quantized Breakdown Voltage Signals to Determine the Maximum Electric Fields in a Quantum Hall Effect SampleM E Cage, C F LavinePageof 10