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Journal of Microscopy|November 6, 2010
Evaluating sharpness functions for automated scanning electron microscopyM E Rudnaya, R M M Mattheij, J M L MaubachUltramicroscopy|July 12, 2011
Defocus and twofold astigmatism correction in HAADF-STEMM E Rudnaya, W Van den Broek, R M P Doornbos, et al.Pageof 1