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Ultramicroscopy|March 8, 2003
Determination of the mean inner potential in III-V semiconductors by electron holographyP Kruse, A Rosenauer, D Gerthsen
Applied Optics|January 30, 2010
Schlieren-cinematographic and holographic diagnostic of a laser-produced plasma in xenonM Hugenschmidt, K Vollrath, A Hirth
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 21, 2006
EELS investigations of different niobium oxide phasesD Bach, H Störmer, R Schneider, et al.
Ultramicroscopy|September 5, 2006
Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plateE Majorovits, B Barton, K Schultheiss, et al.
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