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M J Hÿtch

Showing results (1-10 of 13) with videos related to

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Ultramicroscopy|December 7, 2007
Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)F Houdellier, M J Hÿtch
Ultramicroscopy|May 4, 2001
Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopyM J Hÿtch, T Plamann
Ultramicroscopy|August 26, 2011
Dark-field electron holography for the measurement of geometric phaseM J Hÿtch, F Houdellier, F Hüe, et al.
Ultramicroscopy|March 22, 2016
Quantitative 3D electromagnetic field determination of 1D nanostructures from single projectionC Phatak, L de Knoop, F Houdellier, et al.
Ultramicroscopy|April 2, 2019
Optimization of off-axis electron holography performed with femtosecond electron pulsesF Houdellier, G M Caruso, S Weber, et al.
Ultramicroscopy|July 10, 2007
Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging techniqueB Warot-Fonrose, F Houdellier, M J Hÿtch, et al.
Journal of Electron Microscopy|August 27, 2005
Calibration of projector lens distortionsF Hüe, C L Johnson, S Lartigue-Korinek, et al.
Nano Letters|February 20, 2013
Electromechanical coupling among edge dislocations, domain walls, and nanodomains in BiFeO3 revealed by unit-cell-wise strain and polarization mapsA Lubk, M D Rossell, J Seidel, et al.
Ultramicroscopy|July 26, 2014
Dynamical effects in strain measurements by dark-field electron holographyE Javon, A Lubk, R Cours, et al.
Nanotechnology|September 7, 2010
Strain mapping in nanowiresJ L Taraci, M J Hÿtch, T Clement, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|December 7, 2007
Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)F Houdellier, M J Hÿtch
Ultramicroscopy|May 4, 2001
Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopyM J Hÿtch, T Plamann
Ultramicroscopy|August 26, 2011
Dark-field electron holography for the measurement of geometric phaseM J Hÿtch, F Houdellier, F Hüe, et al.
Ultramicroscopy|March 22, 2016
Quantitative 3D electromagnetic field determination of 1D nanostructures from single projectionC Phatak, L de Knoop, F Houdellier, et al.
Ultramicroscopy|April 2, 2019
Optimization of off-axis electron holography performed with femtosecond electron pulsesF Houdellier, G M Caruso, S Weber, et al.
Ultramicroscopy|July 10, 2007
Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging techniqueB Warot-Fonrose, F Houdellier, M J Hÿtch, et al.
Journal of Electron Microscopy|August 27, 2005
Calibration of projector lens distortionsF Hüe, C L Johnson, S Lartigue-Korinek, et al.
Nano Letters|February 20, 2013
Electromechanical coupling among edge dislocations, domain walls, and nanodomains in BiFeO3 revealed by unit-cell-wise strain and polarization mapsA Lubk, M D Rossell, J Seidel, et al.
Ultramicroscopy|July 26, 2014
Dynamical effects in strain measurements by dark-field electron holographyE Javon, A Lubk, R Cours, et al.
Nanotechnology|September 7, 2010
Strain mapping in nanowiresJ L Taraci, M J Hÿtch, T Clement, et al.
Pageof 2