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The Review of Scientific Instruments|December 3, 2008
Flat field anomalies in an x-ray charge coupled device camera measured using a Manson x-ray sourceM J Haugh, M B Schneider
Applied Optics|February 3, 2016
High Miller-index germanium crystals for high-energy x-ray imaging applicationsJ A Koch, J J Lee, M J Haugh
The Review of Scientific Instruments|November 29, 2014
Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystalsM J Haugh, M Wu, K D Jacoby, et al.
The Review of Scientific Instruments|July 3, 2016
Measuring the diffraction properties of an imaging quartz(211) crystalM J Haugh, K D Jacoby, J A Koch, et al.
The Review of Scientific Instruments|December 3, 2016
A technique for measuring the quality of an elliptically bent pentaerythritol [PET(002)] crystalM J Haugh, K D Jacoby, M A Barrios, et al.
The Review of Scientific Instruments|March 3, 2011
High-energy x-ray backlighter spectrum measurements using calibrated image platesB R Maddox, H S Park, B A Remington, et al.
The Review of Scientific Instruments|November 7, 2012
Integrated x-ray reflectivity measurements of elliptically curved pentaerythritol crystalsM J Haugh, S P Regan, K D Jacoby, et al.
The Review of Scientific Instruments|August 1, 2016
A multi-wavelength, high-contrast contact radiography system for the study of low-density aerogel foamsY P Opachich, J A Koch, M J Haugh, et al.
The Review of Scientific Instruments|January 3, 2013
High performance imaging streak camera for the National Ignition FacilityY P Opachich, D H Kalantar, A G MacPhee, et al.
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