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M J de Loos

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 7, 2009
Ultracold electron source for single-shot, ultrafast electron diffractionS B van der Geer, M J de Loos, E J D Vredenbregt, et al.
Physical Review Letters|September 28, 2004
How to realize uniform three-dimensional ellipsoidal electron bunchesO J Luiten, S B van der Geer, M J de Loos, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|May 15, 2002
Nonlinear electrostatic emittance compensation in kA, fs electron bunchesS B van der Geer, M J de Loos, J I M Botman, et al.
Physical Review Letters|January 15, 2011
Compression of subrelativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffractionT van Oudheusden, P L E M Pasmans, S B van der Geer, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 7, 2009
Ultracold electron source for single-shot, ultrafast electron diffractionS B van der Geer, M J de Loos, E J D Vredenbregt, et al.
Physical Review Letters|September 28, 2004
How to realize uniform three-dimensional ellipsoidal electron bunchesO J Luiten, S B van der Geer, M J de Loos, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|May 15, 2002
Nonlinear electrostatic emittance compensation in kA, fs electron bunchesS B van der Geer, M J de Loos, J I M Botman, et al.
Physical Review Letters|January 15, 2011
Compression of subrelativistic space-charge-dominated electron bunches for single-shot femtosecond electron diffractionT van Oudheusden, P L E M Pasmans, S B van der Geer, et al.
Pageof 1