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Applied Optics|February 13, 2008
Real-time monitoring and growth control of Si-gradient-index structures by multiwavelength ellipsometryM KildemoApplied Optics|February 21, 2008
Spectroellipsometric method for process monitoring semiconductor thin films and interfacesM Kildemo, R Brenot, B DrévillonApplied Optics|March 18, 2008
Anisotropic incoherent reflection model for spectroscopic ellipsometry of a thick semitransparent anisotropic substrateR Ossikovski, M Kildemo, M Stchakovsky, et al.Applied Optics|February 9, 2008
Real-time control by multiwavelength ellipsometry of plasma-deposited multilayers on glass by use of an incoherent-reflection modelM Kildemo, P Bulkin, B Drévillon, et al.Applied Optics|March 20, 2008
Investigation of a half-wave method for birefringence or thickness measurements of a thick, semitransparent, uniaxial, anisotropic substrate by use of spectroscopic ellipsometryM Kildemo, M Mooney, C Sudre, et al.Optics Letters|September 29, 2017
Critical dimension metrology of a plasmonic photonic crystal based on Mueller matrix ellipsometry and the reduced Rayleigh equationJ-P Banon, T Nesse, Z Ghadyani, et al.Optics Express|February 12, 2014
Anisotropic plasmonic Cu nanoparticles in sol-gel oxide nanopillars studied by spectroscopic Mueller matrix ellipsometryZ Ghadyani, M Kildemo, L M S Aas, et al.Applied Optics|October 3, 2008
Characterization of nanostructured GaSb: comparison between large-area optical and local direct microscopic techniquesI S Nerbø, M Kildemo, S Le Roy, et al.Pageof 1