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Applied Optics
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April 18, 2002
Mueller matrix error correction for a fringe-free interferometry system
M L Begbie, W Sibbett, M J Padgett
Applied Optics
|
February 15, 2008
Fast surface profiling by spectral analysis of white-light interferograms with fourier transform spectroscopy
M Hart, D G Vass, M L Begbie
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of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Applied Optics
|
April 18, 2002
Mueller matrix error correction for a fringe-free interferometry system
M L Begbie, W Sibbett, M J Padgett
Applied Optics
|
February 15, 2008
Fast surface profiling by spectral analysis of white-light interferograms with fourier transform spectroscopy
M Hart, D G Vass, M L Begbie
Page
of 1