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M Le Ster

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Ultramicroscopy|May 14, 2024
Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopyM Le Ster, S Pawłowski, I Lutsyk, et al.
Nanotechnology|March 26, 2020
Removable capping layer for air-sensitive GdNM Le Ster, J R Chan, B J Ruck, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|May 14, 2024
Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopyM Le Ster, S Pawłowski, I Lutsyk, et al.
Nanotechnology|March 26, 2020
Removable capping layer for air-sensitive GdNM Le Ster, J R Chan, B J Ruck, et al.
Pageof 1