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M P Seah

Showing results (1-10 of 12) with videos related to

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The Journal of Physical Chemistry. B|February 18, 2016
Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth ProfilesR Havelund, M P Seah, I S Gilmore
Analytical Chemistry|April 5, 2011
Mass spectrometry and informatics: distribution of molecules in the PubChem database and general requirements for mass accuracy in surface analysisF M Green, I S Gilmore, M P Seah
The Journal of Physical Chemistry. B|January 17, 2015
Angle dependence of argon gas cluster sputtering yields for organic materialsM P Seah, S J Spencer, A G Shard
Journal of the American Society for Mass Spectrometry|March 1, 2006
TOF-SIMS: accurate mass scale calibrationF M Green, I S Gilmore, M P Seah
Journal of the American Society for Mass Spectrometry|February 23, 2018
SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary IonsR Havelund, M P Seah, M Tiddia, et al.
Journal of the American Society for Mass Spectrometry|October 25, 2018
Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment IonsM P Seah, R Havelund, S J Spencer, et al.
The Journal of Physical Chemistry. B|October 1, 2015
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster IonsM P Seah, R Havelund, A G Shard, et al.
Analytical Chemistry|January 2, 2009
Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profilingF M Green, A G Shard, I S Gilmore, et al.
The Analyst|September 2, 2015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster sizeM P Seah, S J Spencer, R Havelund, et al.
The Analyst|June 15, 2016
Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ionsP D Rakowska, M P Seah, J-L Vorng, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
The Journal of Physical Chemistry. B|February 18, 2016
Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth ProfilesR Havelund, M P Seah, I S Gilmore
Analytical Chemistry|April 5, 2011
Mass spectrometry and informatics: distribution of molecules in the PubChem database and general requirements for mass accuracy in surface analysisF M Green, I S Gilmore, M P Seah
The Journal of Physical Chemistry. B|January 17, 2015
Angle dependence of argon gas cluster sputtering yields for organic materialsM P Seah, S J Spencer, A G Shard
Journal of the American Society for Mass Spectrometry|March 1, 2006
TOF-SIMS: accurate mass scale calibrationF M Green, I S Gilmore, M P Seah
Journal of the American Society for Mass Spectrometry|February 23, 2018
SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary IonsR Havelund, M P Seah, M Tiddia, et al.
Journal of the American Society for Mass Spectrometry|October 25, 2018
Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment IonsM P Seah, R Havelund, S J Spencer, et al.
The Journal of Physical Chemistry. B|October 1, 2015
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster IonsM P Seah, R Havelund, A G Shard, et al.
Analytical Chemistry|January 2, 2009
Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profilingF M Green, A G Shard, I S Gilmore, et al.
The Analyst|September 2, 2015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster sizeM P Seah, S J Spencer, R Havelund, et al.
The Analyst|June 15, 2016
Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ionsP D Rakowska, M P Seah, J-L Vorng, et al.
Pageof 2