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Journal of Microscopy|April 16, 2003
Electron spectroscopy imaging to study ELNES at a nanoscaleP Bayle-Guillemaud, G Radtke, M Sennour
Ultramicroscopy|March 12, 2004
Simulation of electron energy loss near-edge structure at the Al and N K edges and Al L(23) edge in cubic aluminium nitrideJ C Le Bossé, M Sennour, C Esnouf, et al.
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