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M Spajer

Showing results (1-10 of 9) with videos related to

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Optics Letters|September 11, 2009
Linear phase detection for a bimodal fiber sensorM Spajer
Applied Optics|June 23, 2010
Model for reflection near field optical microscopyC Girard, M Spajer
Applied Optics|March 25, 2010
In-plane displacement and strain measurement by speckle interferometry and moire derivationM Spajer, P K Rastogi, J Monneret
Journal of Microscopy|April 12, 2001
Shaping the reflection near-field optical probe: finite domain time difference modelling and fabrication using a focused ion beamM Spajer, G Parent, C Bainier, et al.
Applied Optics|April 1, 1997
Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: characterization with a spline and Fourier spectrumD Barchiesi, O Bergossi, M Spajer, et al.
Applied Optics|June 23, 2010
External and internal reflection near field microscopy: experiments and resultsD Courjon, J M Vigoureux, M Spajer, et al.
Journal of Microscopy|April 12, 2001
Near-field optical probing of two-dimensional photonic crystals: theory and experimentD Mulin, C Girard, G Colas Des Francs, et al.
Ultrasonics|October 17, 2009
Characterization of HIFU transducers designed for sonochemistry application: cavitation distribution and quantificationL Hallez, F Touyeras, J-Y Hihn, et al.
Journal of Microscopy|June 5, 2001
Photocurrent near-field microscopy of Schottky barriersC Coluzza, G Di Claudio, S Davy, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Optics Letters|September 11, 2009
Linear phase detection for a bimodal fiber sensorM Spajer
Applied Optics|June 23, 2010
Model for reflection near field optical microscopyC Girard, M Spajer
Applied Optics|March 25, 2010
In-plane displacement and strain measurement by speckle interferometry and moire derivationM Spajer, P K Rastogi, J Monneret
Journal of Microscopy|April 12, 2001
Shaping the reflection near-field optical probe: finite domain time difference modelling and fabrication using a focused ion beamM Spajer, G Parent, C Bainier, et al.
Applied Optics|April 1, 1997
Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: characterization with a spline and Fourier spectrumD Barchiesi, O Bergossi, M Spajer, et al.
Applied Optics|June 23, 2010
External and internal reflection near field microscopy: experiments and resultsD Courjon, J M Vigoureux, M Spajer, et al.
Journal of Microscopy|April 12, 2001
Near-field optical probing of two-dimensional photonic crystals: theory and experimentD Mulin, C Girard, G Colas Des Francs, et al.
Ultrasonics|October 17, 2009
Characterization of HIFU transducers designed for sonochemistry application: cavitation distribution and quantificationL Hallez, F Touyeras, J-Y Hihn, et al.
Journal of Microscopy|June 5, 2001
Photocurrent near-field microscopy of Schottky barriersC Coluzza, G Di Claudio, S Davy, et al.
Pageof 1