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M T Postek

Showing results (1-10 of 7) with videos related to

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Stain Technology|May 1, 1978
Mounting cleared botanical preparationsM T Postek
Transactions of the American Microscopical Society|January 1, 1976
Plate holder unit for the Zeiss 10 transmission electron microscopeM T Postek
Transactions of the American Microscopical Society|April 1, 1974
A container for processing of delicate organisms for scanning or transmission electron microscopyM T Postek, W L Kirk, E R Cox
Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|October 6, 2001
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurementsM T Postek, A E Vladár, O C Wells, et al.
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|September 14, 1999
Image sharpness measurement in the scanning electron-microscope--part IIIN F Zhang, M T Postek, R D Larrabee, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Stain Technology|May 1, 1978
Mounting cleared botanical preparationsM T Postek
Transactions of the American Microscopical Society|January 1, 1976
Plate holder unit for the Zeiss 10 transmission electron microscopeM T Postek
Transactions of the American Microscopical Society|April 1, 1974
A container for processing of delicate organisms for scanning or transmission electron microscopyM T Postek, W L Kirk, E R Cox
Scanning|July 10, 2008
Simulated SEM images for resolution measurementP Cizmar, A E Vladár, B Ming, et al.
Scanning|October 6, 2001
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurementsM T Postek, A E Vladár, O C Wells, et al.
Scanning|January 5, 2002
Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samplesO C Wells, M McGlashan-Powell, A E Vladár, et al.
Scanning|September 14, 1999
Image sharpness measurement in the scanning electron-microscope--part IIIN F Zhang, M T Postek, R D Larrabee, et al.
Pageof 1