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M-I Richard

Showing results (1-10 of 8) with videos related to

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Physical Review Letters|February 1, 2008
Defect cores investigated by x-ray scattering close to forbidden reflections in siliconM-I Richard, T H Metzger, V Holý, et al.
Physical Review Letters|January 15, 2016
Continuous and Collective Grain Rotation in Nanoscale Thin Films during SilicidationM-I Richard, J Fouet, M Texier, et al.
Journal of Nanoscience and Nanotechnology|March 10, 2012
A combined In situ grazing incidence small angle X-ray scattering and grazing incidence X-ray diffraction study of the growth of Ge Islands on pit-patterned Si(001) substratesM-I Richard, T U Schülli, G Renaud, et al.
Physical Review Letters|March 5, 2009
Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si(001) substratesT U Schülli, G Vastola, M-I Richard, et al.
Journal of Synchrotron Radiation|August 18, 2012
In situ three-dimensional reciprocal-space mapping during mechanical deformationT W Cornelius, A Davydok, V L R Jacques, et al.
Journal of Applied Crystallography|June 20, 2022
Bragg coherent diffraction imaging of single 20 nm Pt particles at the ID01-EBS beamline of ESRFM-I Richard, S Labat, M Dupraz, et al.
Nano Letters|October 21, 2017
3D Imaging of a Dislocation Loop at the Onset of Plasticity in an Indented NanocrystalM Dupraz, G Beutier, T W Cornelius, et al.
The Review of Scientific Instruments|October 2, 2017
Reactor for nano-focused x-ray diffraction and imaging under catalytic in situ conditionsM-I Richard, S Fernández, J P Hofmann, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Physical Review Letters|February 1, 2008
Defect cores investigated by x-ray scattering close to forbidden reflections in siliconM-I Richard, T H Metzger, V Holý, et al.
Physical Review Letters|January 15, 2016
Continuous and Collective Grain Rotation in Nanoscale Thin Films during SilicidationM-I Richard, J Fouet, M Texier, et al.
Journal of Nanoscience and Nanotechnology|March 10, 2012
A combined In situ grazing incidence small angle X-ray scattering and grazing incidence X-ray diffraction study of the growth of Ge Islands on pit-patterned Si(001) substratesM-I Richard, T U Schülli, G Renaud, et al.
Physical Review Letters|March 5, 2009
Enhanced relaxation and intermixing in Ge islands grown on pit-patterned Si(001) substratesT U Schülli, G Vastola, M-I Richard, et al.
Journal of Synchrotron Radiation|August 18, 2012
In situ three-dimensional reciprocal-space mapping during mechanical deformationT W Cornelius, A Davydok, V L R Jacques, et al.
Journal of Applied Crystallography|June 20, 2022
Bragg coherent diffraction imaging of single 20 nm Pt particles at the ID01-EBS beamline of ESRFM-I Richard, S Labat, M Dupraz, et al.
Nano Letters|October 21, 2017
3D Imaging of a Dislocation Loop at the Onset of Plasticity in an Indented NanocrystalM Dupraz, G Beutier, T W Cornelius, et al.
The Review of Scientific Instruments|October 2, 2017
Reactor for nano-focused x-ray diffraction and imaging under catalytic in situ conditionsM-I Richard, S Fernández, J P Hofmann, et al.
Pageof 1