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Sensors (Basel, Switzerland)|February 21, 2012
Hall sensors for extreme temperaturesJakub Jankowski, Semir El-Ahmar, Maciej OszwaldowskiJournal of Nanoscience and Nanotechnology|August 7, 2008
Investigation of nanoscratch processes in semiconductor materials for application to maskless patterningAsta Richter, Piotr Kuswik, Maciej Oszwaldowski, et al.Pageof 1