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Marcel Schloz

Showing results (1-10 of 5) with videos related to

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Optics Express|October 19, 2017
Time-resolved high harmonic spectroscopy of dynamical symmetry breaking in bi-circular laser fields: the role of Rydberg statesÁlvaro Jiménez-Galán, Nickolai Zhavoronkov, Marcel Schloz, et al.
Nature Communications|June 10, 2026
Electron ptychography reveals correlated lattice vibrations at atomic resolutionAnton Gladyshev, Benedikt Haas, Thomas C Pekin, et al.
Optics Express|September 29, 2020
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimizationMarcel Schloz, Thomas Christopher Pekin, Zhen Chen, et al.
Scientific Reports|May 30, 2023
Deep reinforcement learning for data-driven adaptive scanning in ptychographyMarcel Schloz, Johannes Müller, Thomas C Pekin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 19, 2024
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series MeasurementsMarcel Schloz, Thomas C Pekin, Hamish G Brown, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Optics Express|October 19, 2017
Time-resolved high harmonic spectroscopy of dynamical symmetry breaking in bi-circular laser fields: the role of Rydberg statesÁlvaro Jiménez-Galán, Nickolai Zhavoronkov, Marcel Schloz, et al.
Nature Communications|June 10, 2026
Electron ptychography reveals correlated lattice vibrations at atomic resolutionAnton Gladyshev, Benedikt Haas, Thomas C Pekin, et al.
Optics Express|September 29, 2020
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimizationMarcel Schloz, Thomas Christopher Pekin, Zhen Chen, et al.
Scientific Reports|May 30, 2023
Deep reinforcement learning for data-driven adaptive scanning in ptychographyMarcel Schloz, Johannes Müller, Thomas C Pekin, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 19, 2024
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series MeasurementsMarcel Schloz, Thomas C Pekin, Hamish G Brown, et al.
Pageof 1