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Marcello Cioni

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Micromachines|August 28, 2025
On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTsGiovanni Giorgino, Cristina Miccoli, Marcello Cioni, et al.
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Showing results (1-10 of 1) with videos related to

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Pageof 1
Micromachines|August 28, 2025
On-Wafer Gate Screening Test for Improved Pre-Reliability in p-GaN HEMTsGiovanni Giorgino, Cristina Miccoli, Marcello Cioni, et al.
Pageof 1