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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 12, 2025
A Comprehensive Analysis of Combined AFM/SEM Systems for In-Situ Nanoscale Characterizations and Multiparametric Correlative MicroscopyPrabhu Prasad Swain, Marcos Penedo, Georg Ernest FantnerNanotechnology|September 7, 2013
Gold nanoparticle coated silicon tips for Kelvin probe force microscopy in airSilvia Hormeño, Marcos Penedo, Cristina V Manzano, et al.Nanotechnology|January 29, 2026
Fabrication of ultra-small bimorph cantilevers for high-speed AFM of biological samplesBahareh Ghadiani, Nahid Hosseini, Marcos Penedo, et al.Beilstein Journal of Nanotechnology|February 6, 2024
Enhanced feedback performance in off-resonance AFM modes through pulse train samplingMustafa Kangül, Navid Asmari, Santiago H Andany, et al.Nano Letters|March 16, 2018
Halbach Effect at the Nanoscale from Chiral Spin TexturesMiguel A Marioni, Marcos Penedo, Mirko Baćani, et al.Scientific Reports|October 16, 2020
Photothermal excitation efficiency enhancement of cantilevers by electron beam deposition of amorphous carbon thin filmsMarcos Penedo, Ayhan Yurtsever, Keisuke Miyazawa, et al.Small Methods|July 20, 2024
Revealing the Mechanism Underlying 3D-AFM Imaging of Suspended Structures by Experiments and SimulationsMohammad Shahidul Alam, Marcos Penedo, Takashi Sumikama, et al.Nanotechnology|November 13, 2015
Selective enhancement of individual cantilever high resonance modesMarcos Penedo, Silvia Hormeño, Patricia Prieto, et al.Nanoscale|February 24, 2025
Significant reduction of cell invasiveness in nanoneedle insertion into a living cell with an electron-beam-deposited probe: impacts of probe geometry, speed and vibrationMohammad Shahidul Alam, Marcos Penedo, Takehiko Ichikawa, et al.The Journal of Physical Chemistry Letters|June 9, 2022
Computed Three-Dimensional Atomic Force Microscopy Images of Biopolymers Using the Jarzynski EqualityTakashi Sumikama, Filippo Federici Canova, David Z Gao, et al.Pageof 3