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Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theoryMarcus H Mendenhall, David Black, Donald Windover, et al.Journal of Research of the National Institute of Standards and Technology|March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference MaterialsJames P Cline, Marcus H Mendenhall, David Black, et al.Metrologia|June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometerMarcus H Mendenhall, Albert Henins, Donald Windover, et al.Journal of Applied Crystallography|March 14, 2020
The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysisMarcus H Mendenhall, David Black, James P ClineJournal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|August 1, 2017
High-precision measurement of the X-ray Cu Kα spectrumMarcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.Acta Crystallographica. Section A, Foundations and Advances|December 22, 2018
Model-independent extraction of the shapes and Fourier transforms from patterns of partially overlapped peaks with extended tailsMarcus H Mendenhall, James P ClineJournal of Research of the National Institute of Standards and Technology|March 10, 2016
An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line ProfilesMarcus H Mendenhall, Katharine Mullen, James P ClineThe Review of Scientific Instruments|October 3, 2023
The NIST silicon lattice comparator upgradeMarcus H Mendenhall, James P Cline, Csilla I Szabo, et al.Journal of Research of the National Institute of Standards and Technology|July 31, 2024
The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size AnalysisJames P Cline, Marcus H Mendenhall, Joseph J Ritter, et al.Powder Diffraction|November 19, 2021
Certification of SRM 640f line position and line shape standard for powder diffractionDavid R Black, Marcus H Mendenhall, Albert Henins, et al.Pageof 11