Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Applied Optics|July 21, 2015
X-ray Moiré deflectometry using synthetic reference imagesDan Stutman, Maria Pia Valdivia, Michael Finkenthal
Applied Optics|January 13, 2018
Talbot-Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experimentsMaria Pia Valdivia, Dan Stutman, Christian Stoeckl, et al.
Scientific Reports|March 4, 2025
X-ray microscopy and talbot imaging with the matter in extreme conditions X-ray imager at LCLSEric Galtier, Hae Ja Lee, Dimitri Khaghani, et al.
Pageof 1