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Markus C Knauer

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Applied Optics|April 22, 2008
Shape reconstruction from gradient dataSvenja Ettl, Jürgen Kaminski, Markus C Knauer, et al.
Optics Letters|February 19, 2008
Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolutionGerd Häusler, Claus Richter, Karl-Heinz Leitz, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Applied Optics|April 22, 2008
Shape reconstruction from gradient dataSvenja Ettl, Jürgen Kaminski, Markus C Knauer, et al.
Optics Letters|February 19, 2008
Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolutionGerd Häusler, Claus Richter, Karl-Heinz Leitz, et al.
Pageof 1