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Martha Ch Lux-Steiner

Showing results (1-10 of 6) with videos related to

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Physical Review Letters|February 3, 2004
Correct height measurement in noncontact atomic force microscopySascha Sadewasser, Martha Ch Lux-Steiner
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|December 17, 2016
Inkjet-Printed Cu<sub>2</sub>ZnSn(S, Se)<sub>4</sub> Solar CellsXianzhong Lin, Jaison Kavalakkatt, Martha Ch Lux-Steiner, et al.
Physical Review Letters|September 28, 2010
Large neutral barrier at grain boundaries in chalcopyrite thin filmsMichael Hafemeister, Susanne Siebentritt, Jürgen Albert, et al.
Physical Review Letters|December 13, 2006
Evidence for a neutral grain-boundary barrier in chalcopyritesSusanne Siebentritt, Sascha Sadewasser, Mark Wimmer, et al.
Journal of Synchrotron Radiation|October 27, 2010
Extended soft X-ray emission spectroscopy: quantitative assessment of emission intensitiesPaul Pistor, Immo Kötschau, Alex Grimm, et al.
Physical Chemistry Chemical Physics : PCCP|May 11, 2016
Investigation of the potassium fluoride post deposition treatment on the CIGSe/CdS interface using hard X-ray photoemission spectroscopy - a comparative studyBünyamin Ümsür, Wolfram Calvet, Alexander Steigert, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Physical Review Letters|February 3, 2004
Correct height measurement in noncontact atomic force microscopySascha Sadewasser, Martha Ch Lux-Steiner
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|December 17, 2016
Inkjet-Printed Cu<sub>2</sub>ZnSn(S, Se)<sub>4</sub> Solar CellsXianzhong Lin, Jaison Kavalakkatt, Martha Ch Lux-Steiner, et al.
Physical Review Letters|September 28, 2010
Large neutral barrier at grain boundaries in chalcopyrite thin filmsMichael Hafemeister, Susanne Siebentritt, Jürgen Albert, et al.
Physical Review Letters|December 13, 2006
Evidence for a neutral grain-boundary barrier in chalcopyritesSusanne Siebentritt, Sascha Sadewasser, Mark Wimmer, et al.
Journal of Synchrotron Radiation|October 27, 2010
Extended soft X-ray emission spectroscopy: quantitative assessment of emission intensitiesPaul Pistor, Immo Kötschau, Alex Grimm, et al.
Physical Chemistry Chemical Physics : PCCP|May 11, 2016
Investigation of the potassium fluoride post deposition treatment on the CIGSe/CdS interface using hard X-ray photoemission spectroscopy - a comparative studyBünyamin Ümsür, Wolfram Calvet, Alexander Steigert, et al.
Pageof 1